N. N.
Research Area Automation for Laboratories (ATLAS)
Karlsruhe Institute of Technology (KIT)
Institute for Automation and Applied Informatics (IAI)Hermann-von-Helmholtz-Platz 1
76344 Eggenstein-LeopoldshafenFax: +49 721 608 22602
Building-No.: 445 / 449 / 668
Publications
2020
Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
Simicic, M.; MD Ashif, N. R.; Hellings, G.; Chen, S.-H.; Nag, M.; Kronemeijer, A. J.; Myny, K.; Linten, D.
2020. Microelectronics reliability, 108, Article No.113632. doi:10.1016/j.microrel.2020.113632
Simicic, M.; MD Ashif, N. R.; Hellings, G.; Chen, S.-H.; Nag, M.; Kronemeijer, A. J.; Myny, K.; Linten, D.
2020. Microelectronics reliability, 108, Article No.113632. doi:10.1016/j.microrel.2020.113632
2019
Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP
Hellings, G.; Roussel, P.; Wang, N.; Boschke, R.; Chen, S.-H.; Simicic, M.; Scholz, M.; Stoedel, S.; Myny, K.; Linten, D.; Hellings, P.; MD Ashif, N. R.
2019. 2019 IEEE International Reliability Physics Symposium, March 31 - April 4, 2019, Monterey, CA, Art.-Nr.: 8720517, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IRPS.2019.8720517
Hellings, G.; Roussel, P.; Wang, N.; Boschke, R.; Chen, S.-H.; Simicic, M.; Scholz, M.; Stoedel, S.; Myny, K.; Linten, D.; Hellings, P.; MD Ashif, N. R.
2019. 2019 IEEE International Reliability Physics Symposium, March 31 - April 4, 2019, Monterey, CA, Art.-Nr.: 8720517, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IRPS.2019.8720517