Publikationen
2025
Extrusion printing of radio frequency coplanar waveguides with commercial dispensing equipment
Md Ashif, N. R.; Gengenbach, U.; Maier, P.; Kotz, A.; Koos, C.; Sieber, I.
2025. Flexible and Printed Electronics, 10 (2), Art.-Nr.: 025007. doi:10.1088/2058-8585/add603
Md Ashif, N. R.; Gengenbach, U.; Maier, P.; Kotz, A.; Koos, C.; Sieber, I.
2025. Flexible and Printed Electronics, 10 (2), Art.-Nr.: 025007. doi:10.1088/2058-8585/add603
Natural and synthetic datasets for rapid deep-learning-based optical measurement of printed linear structures
Polomoshnov, M.; Ashif, N. R. M.; Reischl, M.
2025, April 23. doi:10.35097/kf4tg7xk649w984q
Polomoshnov, M.; Ashif, N. R. M.; Reischl, M.
2025, April 23. doi:10.35097/kf4tg7xk649w984q
2024
Process Development for Digital Fabrication of Radio Frequency Transmission Lines with Off-the-Shelf Equipment
MD Ashif, N. R.; Gengenbach, U.; Sieber, I.
2024. 2024 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 1–5, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DTIP62575.2024.10613213
MD Ashif, N. R.; Gengenbach, U.; Sieber, I.
2024. 2024 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 1–5, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DTIP62575.2024.10613213
2020
Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
Simicic, M.; MD Ashif, N. R.; Hellings, G.; Chen, S.-H.; Nag, M.; Kronemeijer, A. J.; Myny, K.; Linten, D.
2020. Microelectronics reliability, 108, Article No.113632. doi:10.1016/j.microrel.2020.113632
Simicic, M.; MD Ashif, N. R.; Hellings, G.; Chen, S.-H.; Nag, M.; Kronemeijer, A. J.; Myny, K.; Linten, D.
2020. Microelectronics reliability, 108, Article No.113632. doi:10.1016/j.microrel.2020.113632
2019
Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP
Hellings, G.; Roussel, P.; Wang, N.; Boschke, R.; Chen, S.-H.; Simicic, M.; Scholz, M.; Stoedel, S.; Myny, K.; Linten, D.; Hellings, P.; MD Ashif, N. R.
2019. 2019 IEEE International Reliability Physics Symposium, March 31 - April 4, 2019, Monterey, CA, Art.-Nr.: 8720517, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IRPS.2019.8720517
Hellings, G.; Roussel, P.; Wang, N.; Boschke, R.; Chen, S.-H.; Simicic, M.; Scholz, M.; Stoedel, S.; Myny, K.; Linten, D.; Hellings, P.; MD Ashif, N. R.
2019. 2019 IEEE International Reliability Physics Symposium, March 31 - April 4, 2019, Monterey, CA, Art.-Nr.: 8720517, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IRPS.2019.8720517