Publikationen

Automated Characterisation of Printed Electronics Under Adjustable Ambient Conditions
Ungerer, M.; Chen, Z.; Mach, T. P.; Reichert, K.-M.; Gengenbach, U.; Lindmüller, M.; Binder, J. R.; Reischl, M.; Koker, L.
2024. 2024 International Semiconductor Conference (CAS), Sinaia, Romania, 09-11 October 2024, 69–72, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CAS62834.2024.10736741